The noise properties of granular phosphors used in X-ray imaging detectors are studied in terms of a noise transfer function, NTF. This study is performed in high-exposure conditions where the contribution of structure noise to total screen noise is considerable. An analytical model, based on the cascaded linear systems methodology presented in the literature, is developed. This model takes into account the quantum noise and structure noise. Furthermore, it considers the effect of the K X-rays reabsorption on the phosphor material and the effect of screen thickness on the NTF. The model was validated against experimental results obtained by a set of Zn2SiO4:Mn phosphor screens prepared by sedimentation. The model may be used to evaluate the effect of screen thickness and the effect of the characteristic X-rays on NTF in high-exposure conditions where structure noise is considerable.