Line width roughness effects on device performance

dc.contributor.author	Κωνσταντούδης, Βασίλειος	el
dc.contributor.author	Γογγολίδης, Ευάγγελος	el
dc.contributor.author	Πάτσης, Γεώργιος	el
dc.date.accessioned	2015-05-16T18:10:47Z
dc.date.issued	2015-05-16
dc.identifier.uri	http://hdl.handle.net/11400/10547
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://ieeexplore.ieee.org	el
dc.subject	Semiconductor device
dc.subject	Συσκευή ημιαγωγών
dc.subject	Microelectronics
dc.subject	Μικροηλεκτρονική
dc.title	Line width roughness effects on device performance	en
heal.type	conferenceItem
heal.secondaryTitle	the role of the gate width design	en
heal.classification	Technology
heal.classification	Electronics
heal.classification	Τεχνολογία
heal.classification	Ηλεκτρονική
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85133147
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85042383
heal.classificationURI	N/A-Τεχνολογία
heal.classificationURI	N/A-Ηλεκτρονική
heal.identifier.secondary	DOI: 10.1109/MIEL.2010.5490486
heal.dateAvailable	10000-01-01
heal.language	en
heal.access	forever
heal.publicationDate	2010-05-16
heal.bibliographicCitation	Constantoudis, V., Gogolides, E. and Patsis, G. (2010) Line width roughness effects on device performance: the role of the gate width design. In 27th International Conference on Microelectronics. Proceedings. 16th to 19th May 2010. Nis, p.265 - 268	en
heal.abstract	The role of the gate width in the effects of Line Width Roughness (LWR) on transistor performance is investigated. Two mathematical results regarding the statistical nature of LWR are presented and discussed. Exploiting the implications of these results through a 2D modeling approach, we indicate that, for fixed LWR, transistors with large gate widths seem to mitigate the degradation effects of LWR on transistor performance.	en
heal.publisher	ΙΕΕΕ	en
heal.fullTextAvailability	false
heal.conferenceName	27th International Conference on Microelectronics	en
heal.conferenceItemType	poster