Vapor sorption in thin supported polymer films studied by white light interferometry

dc.contributor.author	Μανώλη, Κυριακή	el
dc.contributor.author	Γουστουρίδης, Δημήτριος	el
dc.contributor.author	Χατζανδρούλης, Σταύρος Ε.	el
dc.contributor.author	Ράπτης, Ιωάννης Α.	el
dc.contributor.author	Βαλαμόντες, Ευάγγελος Σ.	el
dc.date.accessioned	2015-05-18T16:48:33Z
dc.date.available	2015-05-18T16:48:33Z
dc.date.issued	2015-05-18
dc.identifier.uri	http://hdl.handle.net/11400/10676
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://www.elsevier.com	en
dc.subject	Poly(2-hydroxyethyl methacrylate)
dc.subject	Polymethylmethacrylate
dc.subject	Vapor sorption
dc.subject	Πολυ (μεθακρυλικό μεθύλιο)
dc.subject	Προσρόφηση ατμών
dc.title	Vapor sorption in thin supported polymer films studied by white light interferometry	en
heal.type	journalArticle
heal.classification	Technology
heal.classification	Chemical technology
heal.classification	Τεχνολογία
heal.classification	Χημική τεχνολογία
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85133147
heal.classificationURI	http://skos.um.es/unescothes/C00565
heal.classificationURI	N/A-Τεχνολογία
heal.classificationURI	N/A-Χημική τεχνολογία
heal.keywordURI	http://id.loc.gov/authorities/subjects/sh89000009
heal.contributorName	Σανοπούλου, Μερόπη	el
heal.identifier.secondary	DOI: 10.1016/j.polymer.2006.06.016
heal.language	en
heal.access	campus
heal.publicationDate	2006-08-09
heal.bibliographicCitation	MANOLI, K., GOUSTOURIDIS, D., CHATZANDROULIS, S.E., RAPTIS, I.A., VALAMONTES, E.S., et al. (2006). Vapor sorption in thin supported polymer films studied by white light interferometry. Polymer. [online] 47 (17). p. 6117-6122. Available from: http://www.elsevier.com/[Accessed 07/07/2006]	en
heal.abstract	In the present study, we apply a white light interferometric methodology to study sorption of moisture and methanol vapor in thin films of poly(2-hydroxyethyl methacrylate) [PHEMA] and poly(methyl methacrylate) [PMMA], supported on oxidized silicon wafers. The measured equilibrium thickness expansion of each film, exposed to different activities of the vapor penetrant, is used to determine the sorption isotherm of the system. Results for relatively thick films (100 nm < Lo < 600 nm) are compared with corresponding literature data for bulk, free-standing films, obtained by direct gravimetric methods. Furthermore, PMMA films of thicknesses lower than 100 nm were employed in order to study the effect of the dry film's thickness, and of substrate, on fractional swelling.	en
heal.publisher	Elsevier	en
heal.journalName	Polymer	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	true