dc.contributor.author | Ξενούλης, Αλέξανδρος Χ. | el |
dc.contributor.author | Τσουρής, Π. | el |
dc.contributor.author | Δουκέλλης, Γ, | el |
dc.contributor.author | Μπούκος, Νίκος Κ. | el |
dc.contributor.author | Βαλαμόντες, Ευάγγελος Σ. | el |
dc.date.accessioned | 2015-05-19T09:55:33Z | |
dc.date.available | 2015-05-19T09:55:33Z | |
dc.date.issued | 2015-05-19 | |
dc.identifier.uri | http://hdl.handle.net/11400/10731 | |
dc.rights | Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | Electric field effects | |
dc.subject | Electron microscopy | |
dc.subject | Glow discharges | |
dc.subject | Morphology | |
dc.subject | Particle size analysis | |
dc.subject | Επιπτώσεις ηλεκτρικού πεδίου | |
dc.subject | Μορφολογία | |
dc.subject | Ανάλυση μεγέθους σωματιδίων | |
dc.subject | Ηλεκτρονική μικροσκοπία | |
dc.subject | Πυράκτωση απορρίψεων | |
dc.title | Size selection by cluster drflection in an electric field | en |
heal.type | journalArticle | |
heal.classification | Technology | |
heal.classification | Electrical engineering | |
heal.classification | Τεχνολογία | |
heal.classification | Ηλεκτρολογία Μηχανολογία | |
heal.classificationURI | http://id.loc.gov/authorities/subjects/sh85133147 | |
heal.classificationURI | http://zbw.eu/stw/descriptor/18426-4 | |
heal.classificationURI | **N/A**-Τεχνολογία | |
heal.classificationURI | **N/A**-Ηλεκτρολογία Μηχανολογία | |
heal.keywordURI | http://id.loc.gov/authorities/subjects/sh85055350 | |
heal.contributorName | Chen, YiJia | en |
heal.contributorName | Τσακαλάκος, Θωμάς | el |
heal.identifier.secondary | ISSN: 09659773 | |
heal.language | en | |
heal.access | campus | |
heal.publicationDate | 1997-10 | |
heal.bibliographicCitation | XENOULIS, A.C., TSOURIS, P., DOUKELLIS, G., BOUKOS, N.K., VALAMONTES, E.S., et al. (1997). Size selection by cluster drflection in an electric field. Nanostructured Materials. 8 (7). p. 771-784. | en |
heal.abstract | Deflection by an electric field has been tested as a means to deposit size selected clusters. A hollow-cathode, glow-discharge, source has been used for the production of Cu clusters in the size range between 4 and 38 nm, while afield emission scanning microscope has been used for HREM investigation of the size and morphology of clusters supported on Alfoil. The deflected negative clusters demonstrate size selection as a function of displacement while the positive do not follow the same displacement function. Size selection is also observed in the neutral clusters, with the heaviest clusters deposited at the center of the undeflected beam spot. Implications concerning the synthesis of cluster-composed, nanostructured materials are discussed. | en |
heal.journalName | Nanostructured Materials | en |
heal.journalType | peer-reviewed | |
heal.fullTextAvailability | true |
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