New erbium silicide superstructures

dc.contributor.author	Φράγκης, Νικόλαος	el
dc.contributor.author	Van Tendeloo, Gustaaf	en
dc.contributor.author	Van Landuyt, Joseph	en
dc.contributor.author	Καλτσάς, Γρηγόριος	el
dc.contributor.author	Τραυλός, Αναστάσιος	el
dc.date.accessioned	2015-06-02T15:34:17Z
dc.date.available	2015-06-02T15:34:17Z
dc.date.issued	2015-06-02
dc.identifier.uri	http://hdl.handle.net/11400/14870
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://www.wiley-vch.de/	en
dc.subject	annealing
dc.subject	Thin films
dc.subject	Superstructures
dc.subject	Υπερκατασκευές
dc.subject	Λεπτές ταινίες
dc.subject	Ανόπτηση
dc.title	New erbium silicide superstructures	en
heal.type	journalArticle
heal.secondaryTitle	a study by high resolution electron microscopy	en
heal.classification	Technology
heal.classification	Electrical engineering
heal.classification	Τεχνολογία
heal.classification	Ηλεκτρολογία Μηχανολογία
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85133147
heal.classificationURI	http://zbw.eu/stw/descriptor/18426-4
heal.classificationURI	N/A-Τεχνολογία
heal.classificationURI	N/A-Ηλεκτρολογία Μηχανολογία
heal.keywordURI	http://lod.nal.usda.gov/9664
heal.contributorName	Νασιοπούλου, Ανδρούλα Γ.	el
heal.identifier.secondary	DOI: 10.1002/pssa.2211580114
heal.language	en
heal.access	campus
heal.publicationDate	1996
heal.bibliographicCitation	FRANGIS, N., VAN TENDELOO, G., VAN LANDUYT, J., KALTSAS, G., TRAVLOS, A., et al. (1996). New erbium silicide superstructures: a study by high resolution electron microscopy. Physica Status Solidi (A). [online] 158 (1). p. 107-116. Available from: http://www.wiley-vch.de/[Accessed 16/02/2006]	en
heal.abstract	Erbium silicide thin films are grown on Si(100) substrates under high vacuum by single deposition of Er or co-deposition of Er and Si, followed by annealing. Electron microscopy revealed for both preparations the existence of at least three new types of structural phases of erbium suicide. One has a tetragonal ThSi2 type structure; the other two are orthorhombic superstructures of the first one resulting from ordering of vacancies on the Si sublattice, which leads to a composition of ErSi2-x(0 < x < 0.5).	en
heal.publisher	Wiley-VCH Verlag	en
heal.journalName	Physica Status Solidi (A)	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	true