Experimental measurement of a high resolution CMOS detector
coupled to CsI scintillators under X-ray radiation

dc.contributor.author	Μιχαήλ, Χρήστος Μ.	el
dc.contributor.author	Βαλαής, Ιωάννης Γ.	el
dc.contributor.author	Σεφέρης, Ιωάννης Ε.	el
dc.contributor.author	Καλύβας, Νεκτάριος Ι.	el
dc.contributor.author	Φούντος, Γεώργιος Π.	el
dc.date.accessioned	2015-06-07T10:25:15Z
dc.date.available	2015-06-07T10:25:15Z
dc.date.issued	2015-06-07
dc.identifier.uri	http://hdl.handle.net/11400/15448
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://www.sciencedirect.com/science/article/pii/S1350448715000347	en
dc.subject	Information content
dc.subject	Structured scintillators
dc.subject	Περιεχόμενο πληροφοριών
dc.subject	Οργάνωση σπινθηριστών
dc.title	Experimental measurement of a high resolution CMOS detector coupled to CsI scintillators under X-ray radiation	en
heal.type	journalArticle
heal.classification	Medicine
heal.classification	Biomedical engineering
heal.classification	Ιατρική
heal.classification	Βιοϊατρική τεχνολογία
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh00006614
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85014237
heal.classificationURI	N/A-Ιατρική
heal.classificationURI	N/A-Βιοϊατρική τεχνολογία
heal.contributorName	Κανδαράκης, Ιωάννης Σ.	el
heal.identifier.secondary	doi:10.1016/j.radmeas.2015.02.007
heal.language	en
heal.access	campus
heal.recordProvider	Τ.Ε.Ι. Αθήνας. Σχολή Τεχνολογικών Εφαρμογών. Τμήμα Μηχανικών Βιοϊατρικής Τεχνολογίας Τ.Ε.	el
heal.publicationDate	2015-03
heal.bibliographicCitation	Michail, C., Valais, I., Seferis, I., Kalyvas, N., Fountos, G., et al. (March 2015). Experimental measurement of a high resolution CMOS detector coupled to CsI scintillators under X-ray radiation. Radiation Measurements. 74. pp. 39-46. Elsevier B.V: 2015. Available from: http://www.sciencedirect.com/science/article/pii/S1350448715000347 [Accessed 16/02/2015]	en
heal.abstract	The purpose of the present study was to assess the information content of structured CsI:Tl scintillating screens, specially treated to be compatible to a CMOS digital imaging optical sensor, in terms of the information capacity (IC), based on Shannon's mathematical communication theory. IC was assessed after the experimental determination of the Modulation Transfer Function (MTF) and the Normalized Noise Power Spectrum (NNPS) in the mammography and general radiography energy range. The CMOS sensor was coupled to three columnar CsI:Tl scintillator screens obtained from the same manufacturer with thicknesses of 130, 140 and 170 μm respectively, which were placed in direct contact with the optical sensor. The MTF was measured using the slanted-edge method while NNPS was determined by 2D Fourier transforming of uniformly exposed images. Both parameters were assessed by irradiation under the mammographic W/Rh (130, 140 and 170 μm CsI screens) and the RQA-5 (140 and 170 μm CsI screens) (IEC 62220-1) beam qualities. The detector response function was linear for the exposure range under investigation. At 70 kVp, under the RQA-5 conditions IC values were found to range between 2229 and 2340 bits/mm2. At 28 kVp the corresponding IC values were found to range between 2262 and 2968 bits/mm2. The information content of CsI:Tl scintillating screens in combination to the high resolution CMOS sensor, investigated in the present study, where found optimized for use in digital mammography imaging systems.	en
heal.publisher	Elsevier B.V.	en
heal.journalName	Radiation Measurements	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	true