Embedding test vectors in accumulator - based TPG using progressive search

dc.contributor.author	Βογιατζής, Ιωάννης	el
dc.contributor.author	Ευσταθίου, Κωνσταντίνος	el
dc.contributor.author	Σιδηροπούλου, Κλειώ	el
dc.date.accessioned	2015-06-23T17:58:48Z
dc.date.issued	2015-06-23
dc.identifier.uri	http://hdl.handle.net/11400/17895
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	https://www.ieee.org	en
dc.title	Embedding test vectors in accumulator - based TPG using progressive search	en
heal.type	journalArticle
heal.classification	Technology
heal.classification	Electronics
heal.classification	Τεχνολογία
heal.classification	Ηλεκτρονική
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85133147
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85042383
heal.classificationURI	N/A-Τεχνολογία
heal.classificationURI	N/A-Ηλεκτρονική
heal.dateAvailable	10000-01-01
heal.language	en
heal.access	forever
heal.publicationDate	2013
heal.journalName	Proceedings of the 2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	false