On the response of a europium doped phosphor-coated CMOS digital imaging detector

dc.contributor.author	Σεφέρης, Ιωάννης Ε.	el
dc.contributor.author	Μιχαήλ, Χρήστος Μ.	el
dc.contributor.author	Βαλαής, Ιωάννης Γ.	el
dc.contributor.author	Φούντος, Γεώργιος Π.	el
dc.contributor.author	Καλύβας, Νεκτάριος Ι.	el
dc.date.accessioned	2015-01-20T14:17:06Z
dc.date.available	2015-01-20T14:17:06Z
dc.date.issued	2015-01-20
dc.identifier.uri	http://hdl.handle.net/11400/4327
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://www.elsevier.com	en
dc.subject	Imaging systems--Image quality--Congresses
dc.subject	Scintillating detectors
dc.subject	Ποιότητα εικόνας
dc.subject	Σπινθηροβόλοι ανιχνευτές
dc.title	On the response of a europium doped phosphor-coated CMOS digital imaging detector	en
heal.type	journalArticle
heal.classification	Medicine
heal.classification	Physics
heal.classification	Ιατρική
heal.classification	Φυσική
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh00006614
heal.classificationURI	http://skos.um.es/unescothes/C02994
heal.classificationURI	N/A-Ιατρική
heal.classificationURI	N/A-Φυσική
heal.keywordURI	http://id.loc.gov/authorities/subjects/sh2008123039
heal.contributorName	Στρωματία, Φωτεινή	el
heal.contributorName	Οικονόμου, Γ.	el
heal.contributorName	Κανδαράκης, Ιωάννης Σ.	el
heal.contributorName	Παναγιωτάκης, Γεώργιος Σ.	el
heal.identifier.secondary	doi:10.1016/j.nima.2013.06.107
heal.language	en
heal.access	free
heal.recordProvider	Τ.Ε.Ι. Αθήνας. Σχολή Τεχνολογικών Εφαρμογών. Τμήμα Μηχανικών Βιοϊατρικής Τεχνολογίας Τ.Ε.	el
heal.publicationDate	2013
heal.bibliographicCitation	Seferis, I., Michail, C., Valais, I., Fountos, G., Kalyvas, N., et al. (November 2013). On the response of a europium doped phosphor-coated CMOS digital imaging detector. Nuclear Instruments and Methods in Physics Research A. vol. 729. pp. 307–315. Available from: http://www.sciencedirect.com [Accessed 19/07/2013]	en
heal.abstract	Purpose The purpose of the present study was to assess the information content of a high resolution active pixel CMOS imaging sensor coupled to Gd2O2S:Eu phosphor screens in terms of single index image quality metrics such as the information capacity (IC) and the noise equivalent passband (Ne). Methods The CMOS sensor was coupled to two Gd2O2S:Eu scintillator screens with coating thicknesses of 33.3 and 65.1 mg/cm2. IC and Ne were obtained by means of experimentally determined parameters such as the modulation transfer function (MTF), the detective quantum efficiency (DQE) and the noise equivalent quanta (NEQ). Measurements were performed using the standard IEC-RQA5 radiation beam quality (70 kVp) and a W/Rh beam quality (28 kVp). Results It was found that the detector response function was linear for the exposure ranges under investigation. At 70 kVp, under the RQA 5 conditions IC values were found to range between 1730 and 1851 bits/mm2 and Ne values were found between 2.28 and 2.52 mm−1. At 28 kVp the corresponding IC values were found to range between 2535 and 2747 bits/mm2, while the Ne values were found between 5.91 and 7.09 mm−1. Conclusion IC and Ne of the red emitting phosphor/CMOS sensor combination were found with high values suggesting an acceptable imaging performance in terms of information content and sharpness, for X-ray digital imaging.	en
heal.publisher	Elsevier Science Ltd	en
heal.journalName	Nuclear Instruments and Methods in Physics Research A	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	true