A sic pair generator for a bilbo environment

dc.contributor.author	Βογιατζής, Ιωάννης	el
dc.contributor.author	Κεχαγιάς, Ιωάννης Δημ. (1971-)	el
dc.date.accessioned	2015-03-18T07:30:44Z
dc.date.available	2015-03-18T07:30:44Z
dc.date.issued	2015-03-18
dc.identifier.uri	http://hdl.handle.net/11400/8099
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://www.worldscientific.com/doi/abs/10.1142/S0218126606003350	el
dc.subject	Built-In Self Test
dc.subject	SIC pairs
dc.subject	SIC ζεύγη
dc.subject	BILBO registers
dc.subject	Μητρώα BILBO
dc.subject	Two-pattern test generation
dc.subject	Delay fault testing
dc.subject	Έλεγχος βραχυκυκλώματος καθυστέρηση
dc.title	A sic pair generator for a bilbo environment	en
heal.type	journalArticle
heal.classification	Computer science
heal.classification	Computer programming
heal.classification	Πληροφορική
heal.classification	Προγραμματισμός
heal.classificationURI	http://data.seab.gr/concepts/77de68daecd823babbb58edb1c8e14d7106e83bb
heal.classificationURI	http://skos.um.es/unescothes/C00749
heal.classificationURI	N/A-Πληροφορική
heal.classificationURI	N/A-Προγραμματισμός
heal.identifier.secondary	DOI: 10.1142/S0218126606003350
heal.language	en
heal.access	free
heal.recordProvider	Τεχνολογικό Εκπαιδευτικό Ίδρυμα Αθήνας.Σχολή Τεχνολογικών Εφαρμογών.Τμήμα Μηχανικών Πληροφορικής	el
heal.publicationDate	2006-10
heal.bibliographicCitation	Voyiatzis, I. & Kehagias, D. (2006) A sic pair generator for a bilbo environment. "Journal of Circuits, Systems and Computers". 15(5). pp. 01 – 18.	en
heal.abstract	Built-In Self Test (BIST) techniques are commonly used as an efficient alternative to external testing in today's high-complexity VLSI chips since they provide on-chip test pattern generation and response verification. Among the BIST techniques, Built-In Logic Block Observation (BILBO) has been widely used in practice. Test patterns generated by BILBO structures target the detection of stuck-at faults. It has been shown that most common failure mechanisms that appear into current CMOS VLSI circuits cannot be modeled as stuck-at faults. These mechanisms, modeled by sequential (i.e., stuck-open and delay) faults models, require the application of two-pattern tests (vector pairs) in the circuit-under-test inputs. Single Input Change (SIC) pairs are pairs of patterns where the second pattern differs from the first in only one bit and have been successfully used for two-pattern testing. In this paper we present the BILBO-oriented SIC pair Generator technique that extends BILBO in order to generate SIC pairs; in this way, sequential faults are also detected. Read More: http://www.worldscientific.com/doi/abs/10.1142/S0218126606003350	en
heal.journalName	Journal of Circuits, Systems and Computers	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	false