Low temperature dielectric relaxations in ZnO varistor

dc.contributor.author	Τσώνος, Χρήστος	el
dc.contributor.author	Καναπίτσας, Αθανάσιος	el
dc.contributor.author	Τριάντης, Δήμος Α.	el
dc.contributor.author	Αναστασιάδης, Κίμων	el
dc.contributor.author	Σταύρακας, Ηλίας	el
dc.date.accessioned	2015-04-04T21:04:14Z
dc.date.available	2015-04-04T21:04:14Z
dc.date.issued	2015-04-05
dc.identifier.uri	http://hdl.handle.net/11400/8230
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	http://www.jsap.or.jp/	en
dc.subject	Spectroscopy
dc.subject	Cole–Davidson behaviour
dc.subject	Debye temperature of ZnO
dc.subject	Φασματοσκοπία
dc.subject	Cole-Davidson συμπεριφορά
dc.subject	Θερμοκρασία Debye του ZnO
dc.title	Low temperature dielectric relaxations in ZnO varistor	en
heal.type	journalArticle
heal.classification	Science
heal.classification	Physics
heal.classification	Επιστήμες
heal.classification	Φυσική
heal.classificationURI	http://zbw.eu/stw/descriptor/15685-2
heal.classificationURI	http://zbw.eu/stw/descriptor/15669-0
heal.classificationURI	N/A-Επιστήμες
heal.classificationURI	N/A-Φυσική
heal.contributorName	Πίσσης, Πολύκαρπος	el
heal.identifier.secondary	doi:10.1143/JJAP.49.051102
heal.language	en
heal.access	campus
heal.publicationDate	2010
heal.bibliographicCitation	TSONOS, C., KANAPITSAS, A., TRIANTIS, D.A., ANASTASIADIS, C., STAVRAKAS, I. ET AL. (2010). Low temperature dielectric relaxations in ZnO varistor. Japanese Journal of Applied Physics. [Online] 49 (051102). Available from: http://iopscience.iop.org/	en
heal.abstract	The main purpose of this work is to study the behaviour of ZnO varistor by means of dielectric relaxation spectroscopy at the low temperature range. The complex frequency spectrum of dielectric losses has been studied in detail and analysed carefully by fitting of a sum of Havriliak–Negami expression. Three relaxation processes are studied here, exhibiting a very strong Cole–Davidson behaviour. The faster relaxation process shows an unusual thermal behaviour. Initially, its relaxation time increases as the temperature rises but later it becomes thermally activated. The transition temperature of thermal behaviour of this process was found very close to the characteristic value of 0.4θD=160 K, where θD is the Debye temperature of ZnO. The de-activation energy of this process has been estimated by using the Arrhenius type relation to be 78 meV, a value very close to the higher longitudinal optical (LO) phonon energy in ZnO, 72 meV. This is a strong indication that the predicted Holstein transition between large to small-polaron motion should be observed in ZnO. The two remaining relaxations are electronic processes, the slower one is associated with the doubly ionised zinc interstitial Zni••, while the other should be related to defects induced by the dopants, or of complexes of intrinsic native defect with dopant impurities.	en
heal.publisher	Japan Society of Applied Physics	en
heal.journalName	Japanese Journal of Applied Physics	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	true