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dc.contributor.author Κάβουρας, Διονύσης Α. el
dc.contributor.author Κανδαράκης, Ιωάννης Σ. el
dc.contributor.author Πρασόπουλος, Παναγιώτης Π. el
dc.contributor.author Κανελλόπουλος, Ε. el
dc.contributor.author Νομικός, Κωνσταντίνος Δ. el
dc.date.accessioned 2015-05-04T12:41:11Z
dc.date.issued 2015-05-04
dc.identifier.uri http://hdl.handle.net/11400/9656
dc.rights Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.source http://www.ncbi.nlm.nih.gov/pubmed/10080737 en
dc.source http://acr.sagepub.com/content/40/2/211.long en
dc.subject Phosphor
dc.subject Phosphor screens
dc.subject Φώσφορος
dc.subject Εικόνες φωσφόρου
dc.title A method to evaluate the performance of x-ray imaging scintillators by means of the brightness-sharpness index (BSI) en
heal.type journalArticle
heal.classification Medicine
heal.classification Physics
heal.classification Ιατρική
heal.classification Φυσική
heal.classificationURI http://id.loc.gov/authorities/subjects/sh00006614
heal.classificationURI http://skos.um.es/unescothes/C02994
heal.classificationURI **N/A**-Ιατρική
heal.classificationURI **N/A**-Φυσική
heal.contributorName Παναγιωτάκης, Γεώργιος Σ. el
heal.identifier.secondary doi: 10.3109/02841859909177741
heal.dateAvailable 10000-01-01
heal.language en
heal.access forever
heal.recordProvider Τ.Ε.Ι. Αθήνας. Σχολή Τεχνολογικών Εφαρμογών. Τμήμα Μηχανικών Βιοϊατρικής Τεχνολογίας Τ.Ε. el
heal.publicationDate 1999
heal.bibliographicCitation Cavouras, D., Kandarakis, I., Prassopoulos, P., Kanellopoulos, E., Nomicos, C., et al. (March 1999). A method to evaluate the performance of x-ray imaging scintillators by means of the brightness-sharpness index (BSI). Acta Radiologica. 40(2). pp. 211-216. SAGE Publications: 1999. en
heal.abstract PURPOSE: To propose an image quality index, the brightness-sharpness index (BSI), for assessing the quality of the image produced by phosphors of medical imaging detectors. MATERIAL AND METHODS: BSI was evaluated by experimental X-ray luminescence and modulation transfer function measurements. BSI was determined for a number of test phosphor screens prepared from Gd2O2S:Tb, La2O2S:Tb, and Y2O2S:Tb phosphor materials. The screens covered a wide range of coating thicknesses from 50 to 150 mg/cm2 and measurements were performed for X-ray tube voltages between 50 and 120 kVp. RESULTS: Gd2O2S:Tb phosphor exhibited higher brightness and sharpness, as compared to the other phosphor materials, for all screens and X-ray tube voltages used. Best Gd2O2S:Tb performance was observed for thin screens and high tube voltages. La2O2S:Tb exhibited higher BSI values than Y2O2S:Tb for medium and high tube voltages. CONCLUSION: Results showed that phosphor materials of high X-ray detection and X-ray-to-light conversion properties exhibit high BSI values indicating that BSI may provide a means of phosphor performance evaluation for imaging applications. en
heal.publisher SAGE Publications en
heal.journalName Acta Radiologica en
heal.journalType peer-reviewed
heal.fullTextAvailability false


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Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες Except where otherwise noted, this item's license is described as Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες