Embedding test vectors in accumulator - based TPG using progressive search

dc.contributor.author	Βογιατζής, Ιωάννης	el
dc.contributor.author	Ευσταθίου, Κωνσταντίνος	el
dc.contributor.author	Σιδηροπούλου, Κλειώ	el
dc.date.accessioned	2015-06-10T23:52:37Z
dc.date.issued	2015-06-11
dc.identifier.uri	http://hdl.handle.net/11400/15673
dc.rights	Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.source	https://www.ieee.org	en
dc.subject	Test vectors
dc.subject	Διανύσματα δοκιμής
dc.title	Embedding test vectors in accumulator - based TPG using progressive search	en
heal.type	journalArticle
heal.classification	Technology
heal.classification	Electronics
heal.classification	Τεχνολογία
heal.classification	Ηλεκτρονική
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85133147
heal.classificationURI	http://id.loc.gov/authorities/subjects/sh85042383
heal.classificationURI	N/A-Τεχνολογία
heal.classificationURI	N/A-Ηλεκτρονική
heal.identifier.secondary	DOI: 10.1109/DTIS.2013.6527800
heal.dateAvailable	10000-01-01
heal.language	en
heal.access	forever
heal.publicationDate	2013
heal.bibliographicCitation	Voyiatzis, I., Efstathiou, C. and Sgouropoulou, C. (2013) Embedding test vectors in accumulator - based TPG using progressive search. "Proceedings of the 2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era", 2013, p.169-170	en
heal.abstract	In this paper we present a novel solution to the test vector-embedding problem for sequences generated by accumulators. The time overhead of the solution is of the order O(k), where k is an arbitrarily small constant. Comparisons with previously proposed schemes indicate that the proposed method results in lower test application time.	en
heal.journalName	Proceedings of the 2013 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era	en
heal.journalType	peer-reviewed
heal.fullTextAvailability	false